ToF-SIMS Parallel Imaging MS/MS of Lead Soaps in Embedded Paint Cross Sections

ToF-SIMS imaging datasets of multilayered paint cross sections, embedded in polypol resin. It contains a positive and negative polarity ToF-SIMS image of Sample 1, a positive polarity MS/MS image of Sample 2, and a positive polarity MS/MS image of Sample 3. TOF-SIMS analyses were performed on a PHI nanoTOF II instrument (Physical Electronics, Chanhassen, MN, USA) equipped with a 30keV Bi<sub>n</sub><sup>q+</sup> liquid metal ion gun (LMIG) used as an analysis beam, and an Ar gas cluster ion beam (GCIB; 10keV) for nondestructive sputter cleaning.