Crystallographic data and refinement statistics.

Statistics from the current model. aRsym = Σ|Ii−|/Σ|Ii| where Ii is the intensity of the ith measurement, and is the mean intensity for that reflection. bRwork = Σ| Fobs−Fcalc|/Σ|Fobs| where Fcalc and Fobs are the calculated and observed structure factor amplitudes, respectively. cRfree = as for Rwork, but for 10.0% of the total reflections chosen at random and omitted from refinement. *Values in the parenthesis are the highest resolution bin values.