Data for: Fabrication of bimorph lead zirconate titanate thick films on metal substrates via the cold sintering process
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资源简介：
"PZT on Cu post anneal T XRD" is the raw data for the XRD of PZT on Cu.
"PZT on Cu tape C-D" is the dielectric permittivity-loss of PZT on Cu.
"Dixiong Wang EDS_Site 3_Ti K series" is the EDS line scan of as cold sintered PZT on Cu.
"Dixiong Wang EDS_post sinter Site 2_Ti K series" is the EDS line scan of cold sintered and 800 C post-annealed PZT on Cu.
"PZT on Ni C-D" is the permittivity-loss vs frequency of cold sintered and 700 C post-annealed PZT on LNO/HfO2/Ni.
"LNO_HfO2_Ni 700_900C XRD" is the XRD of LNO/HfO2/Ni foil annealed at different temperatures.
创建时间：
2021-04-26
