Supplementary Material
收藏DataCite Commons2025-01-27 更新2025-03-22 收录
下载链接:
https://aip.figshare.com/articles/dataset/Supplementary_Material/28219373
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资源简介:
Supplementary material for details on the calibration of LIT detected temperature, structural characterization of the thin films, systematic sources of errors, and magnetic field dependence of temperature modulation signals.
提供机构:
AIP Publishing
创建时间:
2025-01-16



