Surface Topography Challenge - A17

CrN on silica wafer, prepared by Jacobs Lab for Surface Topography Challenge

NOTE: This result was part of the Surface Topography Challenge of 2022-2025. After seeing initial results of the Challenge (Pradhan et al., presented at STLE 2024 and GRC 2024), we believe the WLI measurements may contain optical artifacts. In particular, the study applied a length scale cutoff value of 2 micrometers for all optical techniques, while our initial analysis used a much more lenient cutoff of 500 nm. The other WLI measurements we contributed (Q43-Q44 data) and the AFM measurements we contributed (measurements with "AFM" in the filename) are unaffected by these artifacts. We have adopted the lessons of the Challenge moving forward.