ISIS@MACH-“Neutron and ion- induced SEE in electronic components used in space environment by Thales Alenia Space Italy”

We propose to perform accelerated SEE test in neutron fields of Si electronic devices provided by Thales-Alenia-Space-Italy at ChIPIR. These chips, commonly used on earth, represent an interesting solution for signal acquisition, processing and transmission for micro and nano-satellites in space. We plan to test the Si-chip susceptibility to neutrons on ChIPIR, with the instrument tailored to mimic the neutron energy spectrum in earth and in space environments, in oreder to acquire an accurate diagnosis of neutron faults produced in the Si chip in both environments. We have already performed accelerated ion SEE testing on the same Si Chip. Further purpose is to complement neutron faults with ion faults produced in the chip. Information on the Chip susceptibility to neutrons is a fundamental issue towards the creation of its reliability model.