XPS Cr2P doublet for chromium oxide coating
收藏DataONE2017-06-16 更新2024-06-26 收录
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Scienta ESCA 300 spectrophotometer equipped with a monochromatic Al Kα (1486.6 ev) x-ray source were utilised for the measurements. The obtained XPS data was analysed with CasaXPS software, Shirkley method was used for the background subtraction and the binding energy calibration was implemented by using the C1s peak taking it as 285eV. A mixture of Gaussian and Lorentzian model was used in the fitting of the spectrum
创建时间：
2017-06-16
