Profile: A code for evaluating line profile shapes for optically thick expanding plasmas
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Title of program: PROFILE Catalogue Id: AARK_v1_0 Nature of problem The shape of a spectral line profile emitted from a plasma can be a sensitive indicator of the parameters of the plasma. Traditionally, optically thin profiles have been used for plasma measurements, but optically thick profiles are now increasingly being investigated as diagnostics for dense (e.g. laser-produced plasmas) or large (e.g. the solar corona) plasmas. CORRECTION SUMMARY: Vol:Year:Page 0:unpublished:unpublished "000ACORRECTION 09/01/91" "Unpublished correction to PROFILE: a code for evaluating line profile shapes for optically thick expanding plasmas." G.J. Tallents Note: correction instructions are contained in source code Versions of this program held in the CPC repository in Mendeley Data AARK_v1_0; PROFILE; 10.1016/0010-4655(82)90030-3 This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018)
提供机构:
Mendeley
创建时间:
2019-12-05



