Structure of sustainable lead-free low-melting vanadate glass by neutron and x-ray diffraction

V2O5 based glass with a sealing temperature of around 400ºC is now being applied in electronic devices, such as in crystal oscillators and MEMS devices as an alternative sealant to the toxic low-melting point glass containing lead and fluorine, or gold-tin solder. We have developed Ag2O-V2O5-TeO2 glass system with a sealing temperature of 200-300ºC. However, structure of Ag2O-V2O5-TeO2 is still unknown and hence it is necessary to reveal the relationship between atomistic and electronic structure of the glass and function, which connection can provide crucial information for designing novel materials. Here we propose neutron diffraction measurements on ternary and quaternary vanadium oxide glasses in order to derive reliable structural information with a high real-space resolution.