Characterization of capacitors at low temperature using cryo-X-ray microtomography
收藏官方服务：
资源简介：
We characterize the structural changes in tantalum, multilayer and Al2O3 capacitors at liquid nitrogen temperature.
创建时间：
2024-12-10
社区交流群
科研交流群
商业服务
We characterize the structural changes in tantalum, multilayer and Al2O3 capacitors at liquid nitrogen temperature.