Supplementary data for: K-edge XANES characterization of ultra-thin (V₁₋ₓCrx)₂O₃ films and binary vanadium oxide compounds

This contains X-ray absorption and diffraction data collected at the Swiss Light Source for various vanadium/chromium oxide samples. Supplement to our paper titled: "K-edge XANES characterization of ultra-thin (V1-xCrx)2O3 films and binary vanadium oxide compounds" The file "xanes_sample_table.csv" contains the sample metadata for the respective directories.