NIST test results for paper Towards a Practical Runtime-Accessible True Random Number Generator Based on Commercial Off-The-Shelf Resistive Random Access Memory Modules

This dataset contains detailed NIST test suite measurements for both the NIST SP 800-22 statistical and NIST SP 800-90B entropy source test suite relevant to the paper Towards a Practical Runtime-Accessible True Random Number Generator Based on Commercial Off-The-Shelf Resistive Random Access Memory Modules.
They are sorted in descending SPI frequency and increasing temperature order and further grouped by TRNG type. In some cases, the test suite has only been run on 10 or 11 TRNG responses. This is due to errors during transmission of the other random bit data. This has not affected the debug output which was used to analyse the bit rate(s) and ratio of raw to extracted bits. The entropy test suite could still be applied in some of these cases - alas, some cases could not be resolved and have been ommitted completely in order to not poison the test results.