X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
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资源简介：
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th...
