ToF-SIMS measurement of Pythium ultimum hyphae and Bacillus subtilis vegetative cells and spores

- qualitative analysis of sample composition and yields of secondary ion species
- measurements with a ToF-SIMS.5 (ION-TOF GmbH, Münster)
- measurement in imaging modeof ToF-SIMS.5 in combination with delayed extraction of negative secondary ions
- Mass resolving power above 3000 and lateral resolution of about 130 nm
- 30 keV NanoProbe, 0.02 pA of primary Bi3+ cluster ions in 100 ns pulses with 200 µm repetition period
- analysis in 400 scans/plains with 5 shots of primary Bi3+ cluster ions per pixel -> distributed randomly in 512 x 512 raster over 56 x 56 µm area on silicon wafer
Analysis:
- stacking of scans after lateral drift correction
- total stack was analysed for lateral distribution of ion yields using SurfaceLab 6.5 software (ION-TOF GmbH)