ChipIr commercial access: IROC Technologies
收藏B2FIND2026-04-25 收录
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https://b2find.eudat.eu/dataset/331877cd-73ba-519d-ac79-eb60bc2973ae
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Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons.Radiation effects tests are part of the...
