Influence of electron beam exposure dose on the properties of NbN superconducting nanowires
收藏科学数据银行2025-11-27 更新2026-04-23 收录
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https://www.scidb.cn/detail?dataSetId=f2a5039c805b4edd8c9cccfe101cd9f6
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资源简介:
Figure 1 is a schematic diagram of the process flow made in the PPT, Data of Figure 2 is table data, Figure 3 is SEM image, Data of Figure 4 is resistance data measured using a comprehensive physical property measurement system (PPMS) and parameters analyzed based on these data, Figure 5 is EPS image of extremely low temperature Rs-T and I-V data measured using PPMS, and Data of Figure 6 is resistance data measured using PPMS.
提供机构:
中国科学院上海微系统与信息技术研究所
创建时间:
2025-11-27



