Strain Mapping of Two-Dimensional Heterostructures with Subpicometer Precision
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https://zenodo.org/records/5698859
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The sample is a WS2-WSe2 lateral heterojunction with an in-plane epitaxial interface. The datasets were collected by electron microscope pixel array detector (EMPAD) under the condition described in this paper (Han, et al. Nano Letters, 18, 3746-3751 (2018)). The rotation angle between the real space and diffraction space in these datasets is 15 degrees. The data have also been analyzed in our recent paper (arXiv:2111.06496) and a conference proceeding (Shi, et al. Microsc. Microanal. 27 Suppl 1, 2021).
创建时间：
2021-11-16
