Accumulation based, XRF Ghost Imaging acquisitions

X-ray Fluorescence (XRF) Ghost Imaging (GI) is an emerging imaging technique, that promises compelling advantages in terms of spatial resolution, and dose deposition on the samples. Its implementation has been proven on laboratory sources [1], but it has been hard to implement on synchrotron sources so far. So far, all attempts have used a so-called Computational GI approach. This approach suffers from multiple limitations: flat-field and intensity discrepancies between XRF and mask measurements, drifts in the masks positions, and non-ideal response of the beam intensity monitors. In the proposed experiment, we will develop a new XRF GI acquisition scheme that overcomes the above mentioned limitations. We will develop new acquisition setup and control scheme, in order to simultaneously acquire XRF and mask measurements. This will remove discrepancies between measurements, and reliable intensity monitoring. [1] 10.1364/OPTICA.441682