The test results of GaN p-i-n avalanche photodiodes grown on GaN substrates
收藏DataCite Commons2025-04-27 更新2025-05-18 收录
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资源简介：
The data mainly includes IV testing of devices, current responsiveness testing, and defect emission spectroscopy testing. The IV test includes dark current, photocurrent, and gain. The device simulation results are also included.
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Science Data Bank
创建时间：
2024-03-25
