X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
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https://b2find.eudat.eu/dataset/76883150-768f-55aa-a570-b3e912e1af14
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资源简介：
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks and pigments (for...
