emission images defect samples
收藏NIAID Data Ecosystem2026-03-14 收录
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资源简介：
The emission images are manually inspected in order to select 150 images as defected samples and used to create a dataset considered as the ground truth for machine learning Acknowledgement : Thanks to Denis Dowling from I-Form Advanced Manufacturing Research Centre and his team member Darragh Egan based in University College Dublin for the provision of this data
创建时间：
2022-10-13
