The effect of the graded bilayer design on the strain depth profiles and microstructure of CuW nano-multilayers
收藏Mendeley Data2024-03-27 更新2024-06-27 收录
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https://zenodo.org/record/5084314
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资源简介：
In this document we share: -the XRD in-plane scans acquired on Cu/W multilayers at different incidence angle, -the in-situ stress curvature data acquired during multilayer growth, -the in plane d-spacing derived at different incidence angle, used for the simulation of the strain gradient.
创建时间：
2023-06-28
