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Oscillation test results for different Vdd values at positions X10Y90 and X44Y108

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NIAID Data Ecosystem2026-03-11 收录
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https://zenodo.org/records/154524
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资源简介:
16 files (X10Y90_X_XXV.bin and X44Y108_X_XXV.bin), where X_XX refers to the value of Vdd = oscillation counts generated by a TERO TRNG at placements X10Y90 and X44Y108 on a Xilinx Spartan 6 FPGA, with different voltage levels. Used in above mentioned paper in Figure 3.
创建时间:
2020-01-21
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