Correlative X-ray Computed Tomography and Optical Microscopy Serial Sectioning Data of Additive Manufactured Ti-6Al-4V using External Fiducial Markers

The x-ray computed tomography (XCT) data from five different scans are available for a volume of interest (VOI). Mechanical polish serial sectioning optical microscopy data (SS) for that same VOI is also provided. Each computed tomography system collected data with different processing parameters and acquired different voxel sizes for the sample. The reconstruction from each XCT scan is presented as a stack of TIFs registered with every other data set. These registered TIF stacks only represent the VOI that will correlate with the provided SS data.
The projections for each individual scan are provided in the format they were exported as. Scans A, B, and C contain projection images in 32-bit float format and are provided with corresponding reference and dark current images. Scan C projections are rotated by 90 degrees. Scan D consists of transmission radiographs scaled by 100 in 16-bit integer format with no reference image or dark current image. Scan E consists of transmission radiographs in 16-bit integer format scaled by 65535. Scans A and B include a ‘_shifts.txt’ text file containing the x and y shift of the detector for each projection. Scan A also consisted of an image taken at four different detector positions for each projection angle, and the detector position is included for each of these. The projections are over views from 0 to 360 degrees in a nominally circular trajectory. The corresponding view angle for each projection is provided in the ‘_angles.txt’ file for each scan. If reconstruction algorithms are to be used on these projections, registration of a generated reconstruction to the SS data will need to be accomplished independently. A portion of the projections (1812) for data set E was lost due to a data transfer error. The remaining 1329 projections are provided.
The SS data is presented as a stack of TIFs for the VOI that correlates with the multiple XCT scans. The in-plane resolution of the SS data is 2.8 μm. The average slice thickness for this stack of TIFs is 2.01 μm. The z-height map data is provided as a text file for the actual thicknesses. Accordingly, to effectively transfer the stack of SS images into a 3D data volume, the slices of the stack should be spaced vertically with the average of 2.01 μm between images or according to the actual thicknesses as given from the z-height map.