XPS W samples, before and after annealing
收藏Mendeley Data2026-04-09 收录
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资源简介：
The core level W 4f, C 1s, O 1s, and N 1s are recorded for a tungsten sample before and after annealing at 800 °C; each file contains two columns: the binding energy and the intensity of signal. Details about the preparation of the sample are given in Pappalardo et al. Optics 2022, 3, 216–224. https://doi.org/10.3390/opt3030021
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Marco Minissale
