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High-pressure single-crystal X-ray diffraction on Zn1-xMnxSe and C1-xdHgxTe systems

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ESRF Portal2027-01-01 更新2026-04-23 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-1509169571
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Zn1-xMnxSe and C1-xdHgxTe will be studied by high-pressure X-ray diffraction near the Mn-Se/ HgTe bond percolation threshold (BPT), at which critical Mn/Hg content the minor Mn-Se/ HgTe bonds self-connect into an infinite treelike chain. It is a matter to test whether the large/small contrast in Mn-Se /HgTe and Zn-Se /CdTe bond force constants inferred by Raman scattering near the Mn-Se/ HgTe BPT generates any percolation-type anomaly on the bulk modulus or on the zincblende→rocksalt transition pressure, or not (and remaining the same as measured away from the BPT). Here we propose to evaluate how bond percolation affects to the structural properties on Zn1-xMnxSe and C1-xdHgxTe single crystals modulated under high pressure.
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2027-01-01
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