IROC Technologies / Integrated Circuits SER tests
收藏DataCite Commons2025-07-09 更新2025-04-16 收录
下载链接：
https://data.isis.stfc.ac.uk/doi/INVESTIGATION/115560924/
下载链接
链接失效反馈官方服务：
资源简介：
Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons. Radiation effects tests are part of the overall reliability of electronic components used in several market such as automotive, medical or networking.
提供机构：
ISIS Facility
创建时间：
2022-04-28
