Research data supporting "Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic"
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https://www.repository.cam.ac.uk/handle/1810/253769
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资源简介：
Raw VSM data used to generate the figures of the paper entitled "Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic", as well as the figures in the supplementary material file. The data is presented in 2 columns, column 1 is the applied field in Oe, column 2 is the magnetization (reduced units). For Figure S1, the third column is the derivative of col 2 with respect to the applied field (col 1).
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2021-04-30
