XBIC fidelity , sample stability and sample fidelity tests
收藏ESRF Portal2028-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2271918339
下载链接
链接失效反馈官方服务：
资源简介：
x-ray beam induced current from the noise and how to adhere samples to improve their stability in the x-ray beam
提供机构：
University of Twente, Faculty of Science & Technology, Postbus 217, 7500 AE, Enschede, NETHERLANDS; CNRS, , ., Grenoble, FR; CEA - GRENOBLE, DEPHY/MEM/NRX, 17 Rue des Martyrs, 38000, Grenoble, FR; ESRF, 71 avenue des Martyrs CS 40220, 38043, Grenoble, FR; ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France
创建时间：
2028-01-01
