Structural and electrical characterization raw data of HZO-based ferroelectric devices
收藏资源简介:
This dataset contains structural and electrical characterization data for HZO-based ferroelectric devices. It comprises five CSV files: I-Vs_ferrotester.csv: Current–voltage (I–V) measurements acquired using a ferroelectric tester. Low_Resistance_vs_area.csv: Low-resistance-state resistance as a function of device area. Memristive_electrical_measurements.csv: Electrical measurements characterizing the memristive response of the devices. P-V_loops.csv: Polarization–voltage (P–V) hysteresis loops. XRD_Bragg_Brentano_raw.csv: Raw X-ray diffraction data acquired in Bragg–Brentano geometry. These data support the investigation of the structural properties, ferroelectric behavior, resistive switching, and device-area dependence of HZO-based devices.



