XAS investigations of field induced valence transitions in Eu(Rh1-xIrx)2Si2 series

Using time-resolved x-ray absorption spectroscopy (XAS) measurements, we propose to study the field and temperature induced valence fluctuation in a particular model system, Eu(Rh1-xIrx)2Si2 series. Main aim of the proposal is to identify possible differences in the effects of field and temperature on the average Eu valence within and beyond the critical end point of an existing first order valence transition . A systematic comparison of the field and temperature dependencies of the valence in the vicinity of the critical end point has long been desired, but never been performed using direct probes such as XAS. Expected data will be useful for better understanding the nature of field induced valence fluctuation and relevant field induced phenomena.