Dataset for On-Wafer 16-Term Calibration for Characterization of InP Heterojunction Bipolar Transistors

Summary:This dataset contains example *.s2p files from the on-wafer calibration of InP HBTs (Indium Phosphide Heterojunction Bipolar Transistor) up to 67 GHz. First, the raw measured scattering parameters are corrected by applying an 8-term error model (multiline Thru-Reflect-Line, mTRL), and thereby scattering parameters of actual standards are obtained. A 16-term calibration is then performed to correct the raw transistor scattering parameters. The dataset supplements the following conference paper (source data for Fig. 4 and Fig. 5): A. Kanitkar, R. Doerner, T. K. Johansen, W. Heinrich and T. Flisgen, "On-Wafer 16-Term Calibration for Characterization of InP HBTs Featuring Sub-THz fmax," 2025 55th European Microwave Conference (EuMC), Utrecht, Netherlands, 2025, pp. 687-690, doi: 10.23919/EuMC65286.2025.11235132 (freely downloadable PDF available at https://doi.org/10.5281/zenodo.17876895) The results presented in the paper show that the 16-term calibration improves the way transistor properties are extracted. However, the sensitivity of 16-term calibration against different asymmetric structures such as LOAD-OPEN or LOAD-SHORT, at various biasing conditions, and its validity at higher frequencies remain topics for further investigation. DOI:10.5281/zenodo.23038326 Title:Dataset for On-Wafer 16-Term Calibration for Characterization of InP Heterojunction Bipolar Transistors Creators:Abhijeet Kanitkar (Ferdinand-Braun-Institut (FBH), Germany, ORCID 0009-0000-0997-1688)Ralf Doerner (Ferdinand-Braun-Institut (FBH), Germany, ORCID 0000-0001-5284-6858)Tom K. Johansen (Technical University of Denmark, Denmark, ORCID 0000-0001-8182-1051)Wolfgang Heinrich (Ferdinand-Braun-Institut (FBH), Germany, ORCID 0000-0001-6113-7375)Thomas Flisgen (Brandenburg University of Technology (BTU), Germany, ORCID 0000-0001-8547-5838) License:CC-BY 4.0 International Keywords:InP HBTs, On-wafer measurements, Transistor characterization, 8-term calibration, 16-term calibration Classification:INSPEC B7310N Microwave measurement techniquesINSPEC B7130 Measurement standards and calibrationINSPEC B7110 Measurement theory Project title:On-wafer microwave metrology for future industrial applications (OnMicro) Funder:European Commission Funder ID:10.13039/100019599Grant number: Partnership 23IND10 OnMicro Link to project homepage:https://www.ptb.de/epm2023/onmicro/home Software: The files can be viewed or imported with the METAS VNA Tools software, see https://www.metas.admin.ch/en/vna-tools. The files can be also viewed by any text editor (VIM, Notepad, emacs).