Supplemental Online Material
收藏DataCite Commons2024-08-05 更新2024-08-18 收录
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https://aip.figshare.com/articles/dataset/Supplemental_Online_Material/26334679/1
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资源简介：
In the Supplementary material we describe in detail (1) the deposition of the individual thin films, (2) the fabrication of the studied devices, (3) the resistivity of the individual thin films, (4) the structural and compositional characterization of the NbN thin films and NbN/Al/TiO2 stack, and (5) the normalization of the Andreev point contact spectra.
提供机构：
AIP Publishing
创建时间：
2024-08-05
