High-definition electron diffraction patterns and their indexation results of a polycrystal Al-Mg sample

This dataset of 1200 high-resolution (1200×1600) electron diffraction patterns are acquired from an unstrained polycrystal Al-Mg sample. The patterns are recorded by a Bruker eFlashHD camera mounted on Tescan MAIA3. The sample tilt angle is 70°, the step size 1.625 µm, the beam current 10 nA and the accelerate voltage 20kV. The indexation results, in format 'mat' of Matlab, by integrated digital image correlation with radial distortion (IDIC-D EBSD) are also provided. For each diffraction pattern, 7 parameters are stocked, i.e. the Euler angle triplet (expressed in radians and with reference to the EBSD detector), the coordinates of the projection center, and the radial distortion parameter.

This dataset was discussed in a published paper (https://doi.org/10.1016/j.matchar.2021.111206).