five

Machine Learning Applications for Reliability

收藏
DataCite Commons2024-01-28 更新2025-04-16 收录
下载链接:
http://dataverse.jpl.nasa.gov/citation?persistentId=doi:10.48577/jpl.U4AMOW
下载链接
链接失效反馈
官方服务:
资源简介:
Published literature reports a number of Artificial Neural Networks (ANN) applications to solve problems in the area of circuit design, modelling and fault identification. Motivated by these findings and building upon previous applications of device modelling through ANN, we identify in this article promising areas for reliability processes improvement using ANNs. Because the run faster than simulators, ANN models can provide an impact in the area of Worst-Case Analysis, where a large number of computationally intensive transient simulations may be required. Failure diagnosis is particularly promising in the area of flight circuits, both for ground testing and also for in-flight fault detection and circuit self-correction.
提供机构:
Root
创建时间:
2024-01-28
5,000+
优质数据集
54 个
任务类型
进入经典数据集
二维码
社区交流群

面向社区/商业的数据集话题

二维码
科研交流群

面向高校/科研机构的开源数据集话题

数据驱动未来

携手共赢发展

商业合作