Data underlying the publication: Observation of Non-volatile Anomalous Nernst Effect in Mn5Si3 with Collinear Néel Vector

This file provides the source data of all the figures in the publication of "Observation of Non-volatile Anomalous Nernst Effect in Mn5Si3 with Collinear Neel Vector". This work realize non-volatile anomalous Nernst effect in an altermagnet Mn5Si3 thin film with strain, where the Berry curvature from the intersections of spin-splitting bands instead of tiny net moment determines anomalous Nernst conductivity. The data for different figures are presented in different sheets of the excel file. In each sheet, the first row includes the x and y axis of corresponding figure. The X-ray magnetic linear dichroism and low-temperature XRD experiments were carried out at the Shanghai Synchrotron Radiation Facility (SSRF) in China. Longitudinal and transverse voltage were collected by Keithley 2182A in a PPMS chamber. Magnetization data were obtained by SQUID.

本文件提供了论文《具有共线奈尔矢量（Collinear Neel Vector）的Mn₅Si₃中非易失性反常能斯特效应（Non-volatile Anomalous Nernst Effect）的观测》中所有图表的原始数据。本研究在受应变的反磁体（altermagnet）Mn₅Si₃薄膜中成功实现了非易失性反常能斯特效应，其反常能斯特电导率（Anomalous Nernst Conductivity）由自旋分裂能带（spin-splitting bands）交点处的贝里曲率（Berry curvature）而非微弱的净磁矩决定。不同图表对应的数据分别存储于该Excel文件的不同工作表中。每个工作表的首行标注了对应图表的x轴与y轴变量。X射线磁线性二向色性（X-ray magnetic linear dichroism）与低温X射线衍射实验均在中国上海同步辐射光源（Shanghai Synchrotron Radiation Facility, SSRF）完成。纵向与横向电压通过PPMS腔体内的Keithley 2182A型纳伏表采集获得。磁化强度数据通过超导量子干涉仪（Superconducting Quantum Interference Device, SQUID）获取。