X-ray diffraction data and structure refinement statistics.
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https://figshare.com/articles/dataset/_X_ray_diffraction_data_and_structure_refinement_statistics_/1195167
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1Values in parentheses for are of the highest resolution shell
2Rsym = Σ|Ihi - Ih|/ΣIhi, where Ihi is the scaled intensity of the ith symmetry-related observation of reflection h and Ih is the mean value.
3Rcryst = Σh|Foh - Fch|/ΣhFoh, where Foh and Fch are the observed and calculated structure factor amplitudes for reflection h.
4Value of Rfree is calculated for 5% randomly chosen reflections not included in the refinement.
X-ray diffraction data and structure refinement statistics.
创建时间：
2014-10-06
