Atomic Force Microscopy (AFM) topographic images of the samples of six, four, and three layers of borophene
收藏DataCite Commons2026-03-19 更新2026-05-04 收录
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https://mostwiedzy.pl/en/open-research-data/atomic-force-microscopy-afm-topographic-images-of-the-samples-of-six-four-and-three-layers-of-borophene,318032257357518-0
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资源简介：
The morphology and architecture of the borophene samples were analyzed using an atomic force microscope (AFM). The imaging was performed on Si wafers using a Nanoscope V Multimode 8 instrument.
提供机构：
Gdańsk University of Technology
创建时间：
2026-03-18
