Research data supporting "Structural properties of thin-film ferromagnetic topological insulators"
收藏DataCite Commons2024-12-17 更新2024-08-25 收录
下载链接：
https://www.repository.cam.ac.uk/handle/1810/267919
下载链接
链接失效反馈官方服务：
资源简介：
High-resolution X-ray diffractometry and scanning transmission electron microscopy data, taken on thin films of ferromagnetic topological insulators. The aim of the study was to investigate the influence of substrate choice, film thickness and doping on the unit cell parameters, for a range typically used in electronic devices.
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2017-06-13
