Quantum chips characterization
收藏DataCite Commons2023-05-23 更新2025-04-15 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1209951777
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资源简介：
We will be measuring X-ray reflectivity and other scattering techniques available at the beamline, of various samples that have quantum applications. These sample consist of stacked films with different thickness on Si substrate. We will be using new lenses of ID31 to achieve submicron beamsize. With this capability, we hope to determine the precise thickness and more importantly, the roughness and structure of the different interfaces.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2023-05-23
