Quantum Chip Characterization
收藏ESRF Portal2026-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1315822091
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资源简介：
We will employ the new set of Al lenses to focus the beam down to submicron dimensions. This focused beam will be utilized to characterize various electronic microchips designed for quantum applications, using an innovative technique known as X-ray Reflectivity tomography, which is currently under development.
创建时间：
2026-01-01
