Data underlying the publication: Quantitative Analysis of the Doping and Defect Density in Mixed Sn-Pb Perovskites Mediated by SnF2

Data for SSMC and TRMC results, UV-Vis-NIR spectroscopy, XRD, XPS and SEM results and analysis in the main manuscript and Supporting Information published with DOI: 10.1021/acs.chemmater.5c00816.The raw data were collected in the years 2024-2025, using various structural, compositional, and optoelectronic characterization methods on solution-based spin-coated mixed tin-lead (Sn-Pb) perovskite thin films with varying concentration of tin fluoride (SnF2) additive, combined with absorption spectroscopy analysis on perovskite precursors solutions. All measurements were conducted at room temperature, to study the effect of tin oxidation (SnI2 precursor oxidation) and SnF2 additive on the doping, crystal defect density and charge carrier transport properties in the layers. More specifically, all SSMC and TRMC measurements were conducted under nitrogen. The xy data obtained from X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, and X-ray photoelectron spectroscopy (XPS) were imported into Igor Pro (Wavemetrics). In Igor Pro, these xy data are stored as "waves," corresponding to the values on the x and y axes in the plots. Data for Steady State Microwave Conductance (SSMC) and Time-Resolved Microwave Conductivity (TRMC) were collected directly as waves in Igor Pro on the computers connected to the respective microwave-based setups. Igor Pro was used to generate all data plots. The SEM micrographs were directly saved as .tiff files from the SEM software and converted in .png afterwards.The SSMC results were simulated by COMSOL (finite element method analysis on the microwave cavity cell, for more details see the M.Sc. thesis by Koning, S. J, provided below and as a .pdf in the dataset) to obtain the dark conductivity. The TRMC results were simulated by SIMsalabim (drift-diffusion simulations, for more details see the URL about SIMsalabim provided below) to obtain the parameters governing the charge carrier dynamics.For further information on file formats and naming, the units and abbreviations used for all measured values and labels, and instructions for opening or modifying Igor Pro files, please refer to the README.pdf included in the dataset. It is strongly recommended to consult the corresponding publication for guidance on the files in these datasets, as each file name includes a reference to its associated figure. The main manuscript and Supporting Information of the publication contains details about the characterization instruments and additional data processing specifics.

本数据集包含发表于DOI: 10.1021/acs.chemmater.5c00816的论文正文中及辅助材料里的稳态微波电导（Steady State Microwave Conductance）、时间分辨微波电导率（Time-Resolved Microwave Conductivity）结果，紫外-可见-近红外（UV-Vis-NIR）光谱、X射线衍射（XRD）、X射线光电子能谱（XPS）及扫描电子显微镜（SEM）的测试与分析数据。原始数据采集于2024至2025年，针对含不同浓度氟化亚锡（SnF₂）添加剂的溶液旋涂型锡铅（Sn-Pb）混合钙钛矿薄膜，采用多种结构、组分及光电表征手段进行测试，并同步开展了钙钛矿前驱体溶液的吸收光谱分析。所有测试均在室温下开展，旨在探究锡氧化（碘化亚锡前驱体氧化）与SnF₂添加剂对薄膜掺杂水平、晶体缺陷密度及载流子传输特性的调控作用。具体而言，所有SSMC与TRMC测试均在氮气氛围中完成。由X射线衍射、紫外-可见-近红外光谱及X射线光电子能谱获取的xy轴数据均导入至Igor Pro（Wavemetrics公司开发）中。在Igor Pro内，此类xy轴数据以“波（waves）”格式存储，对应图表横轴与纵轴的数值。稳态微波电导与时间分辨微波电导率的数据直接以波格式在连接对应微波测试装置的电脑端Igor Pro中采集完成，且所有数据图表均由Igor Pro生成。扫描电子显微镜显微图像直接由SEM软件导出为.tiff格式文件，后续转换为.png格式。SSMC结果通过COMSOL完成模拟（针对微波腔体单元的有限元法分析，详细信息可参阅下文提供的Koning, S. J的硕士学位论文，本数据集亦附带该论文的.pdf文件），以获取暗电导率参数。TRMC结果则通过SIMsalabim完成模拟（基于漂移-扩散模拟方法，详细信息可参阅下文提供的SIMsalabim相关网址），以提取调控载流子动力学的相关参数。如需了解文件格式与命名规则、所有测试值及标签所用的单位与缩写，以及打开或修改Igor Pro文件的操作说明，请参阅数据集中附带的README.pdf。强烈建议参考对应发表论文以获取本数据集文件的使用指南，因每个文件名均标注了其对应的图表编号。该论文的正文与辅助材料包含了表征仪器及额外数据处理细节的相关信息。