Dataset: RDF and TID simulation of PDSOI 45nm MOSFET
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资源简介：
Dataset supporting: Chatzikyriakou, Eleni, Redman-White, William and De Groot, Kees (2016) Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability.
创建时间：
2016-11-23
