GaN Schottky I-V dataset and reproducibility code for reliability-aware sparse-temperature measurement planning
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资源简介：
Audited canonical current-voltage dataset and reproducibility materials for reliability-aware sparse-temperature characterization of an Au/Ni/n-GaN Schottky diode. The package contains 5,189 experimental I-V points measured at 19 temperatures from 40 to 400 K, reference Linear/PCHIP leave-one-temperature-out analysis code, and finite-schedule reliability summaries.
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Zenodo创建时间：
2026-09-25
