Integrated circuit static defect detection system for MRAM test experimental data
收藏科学数据银行2023-04-06 更新2026-04-23 收录
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https://www.scidb.cn/detail?dataSetId=fd43ec4222b648f2b2fa07a8350d6c12
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资源简介：
The dataset contains data on electrical parameter changes during laser scanning using an IC static defect scanning localization system of our own design for detecting static defects in MRAM devices. By analyzing the data from abnormal chips compared to normal chips, we identify the areas where abnormal damage may occur.
提供机构：
National Space Science Center
创建时间：
2023-03-23
