Single-event effect measurement on low-cost high-reliability radiation-hard electronic systems

Low cost and high reliability are desirable but conflicting demands on electronic systems needed for applications in harsh environments like spacecraft, aircraft and nuclear reactors. This project is developing a low-cost radiation hard "system-on-chip" to meet these requirements, using the open-source RISC-V microcontroller architecture, and these experiments aims to determine whether - and to what extent - nuclear radiation can cause these devices to fail.