Research data supporting “Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering”
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下载链接：
https://www.repository.cam.ac.uk/handle/1810/261045
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资源简介：
Data generated in the characterization and analysis of the Zinc Tin Oxide thin films (as shown in the Figures in the manuscript)
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2016-11-07
