Tuning AI algorithm for X-ray reflectivity
收藏DataCite Commons2025-09-12 更新2026-05-03 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2233789743
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资源简介：
X-ray reflectivity is one of the main tool for thin film study. Application of AI algorithms allows fast data collection (beam damage reduction) and obtaining structural information about samples right after the data collection. To achieve these goals an algorithm tuning during real experiment is required.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2025-09-12
