Additional file 3 of Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography
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https://springernature.figshare.com/articles/dataset/Additional_file_3_of_Non-destructive_high-content_analysis_of_wheat_grain_traits_using_X-ray_micro_computed_tomography/17468537/1
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Additional file 3: Table S2. Dataset obtained for the same wheat spike scanned at different resolutions as indicated. No significant difference for p
提供机构：
Askew, Karen; Hughes, Aoife; Sauze, Colin; Scotson, Callum P.; Williams, Kevin; Doonan, John H.; Corke, Fiona; Nibau, Candida
创建时间：
2021-12-24
