Replication Data for: "SMaRT Stacking: a Methodology to Produce Optimally Layered EMI Shields with Maximal Green Index using Fused Deposition Modeling"
收藏DataCite Commons2025-07-10 更新2026-05-03 收录
下载链接：
https://rdr.kuleuven.be/citation?persistentId=doi:10.48804/O3PIA6
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资源简介：
Measurements of S-parameters obtained with a Vector Network Analyzer (VNA) in the X-band frequency range (8 - 12 GHz) to train the permittivity function of PLA/MWCNT nanocomposites produced via Fused Deposition Modeling (FDM).
VNA measurements of the optimal stacks are also included.
提供机构：
KU Leuven RDR
创建时间：
2025-07-09
